| |
| 1996 |
| |
| G.Schmahl, P.Guttmann, D.Raasch, P.Fischer, G. Schütz |
| Imaging of Magnetic Domains at BESSY |
| Synchrotron Radiation News, Vol. 9, No. 6 (1996) 35-� 39 |
| |
| P.Fischer, G.Schütz, G.Schmahl, P.Guttmann, D.Raasch |
| Imaging of magnetic domains with the X-ray microscope at BESSY using X-ray magnetic circular dichroism |
| Z. Phys B 101 (1996) 313-316 |
| |
| J. Thieme, J. Niemeyer |
| Fractal characterization of hematite aggregates by x-ray microscopy |
| Geologische Rundschau 85 (1996) 852-856 |
| |
| G. Schmahl, D Rudolph, G. Schneider, J. Thieme, T. Schliebe, B. Kaulich, M. Hettwer |
| Diffraction Optics for X-Ray Imaging |
| In: Nanotechnology - Special Issue of Microelectronics Engineering, eds. P. Vettiger, D. Kern, U. Staufer, Microelectronic Engineering 32 (1996) 351-367 |
| |
| T.Schliebe, G.Schneider, H Aschoff |
| Nanostructuring high resolution phase zone plates in nickel and germanium using cross-linked polymers |
| Microcircuit Engineering (1996) |
| |
| H.Kihara, A.Yamamoto, P.Guttmann, and G.Schmahl |
| Observation of the internal membrane system of COS cells by x-ray microscopy |
| Journal of Electron Spectroscopy and related Phenomena 80 (1996) 369-372 |
| |
| M.F.Trendelenburg, O.V.Zatsepina, T.Waschek, W.Schlegel, H.Tröster, D,Rudolph, G.Schmahl, H.Spring |
| Multiparameter microscopic analysis of nuclear structure and ribosomal gene transcription |
| Histochem Cell Biol 106 (1996) 167 - 192 |
| |
| T.Preis and J.Thieme |
| Dynamical Studies of Aqueous Clay Mineral Dispersions by X-ray Microscopy |
| Langmuir, Vol.12, Nr.4 (1996) 1105 - 1106 |
| |
| A.Irtel v.Brenndorff, B.Niemann, D.Rudolph, and G.Schmahl |
| A Monochromator for Scanning X-Ray Microscopy Beamlines at 3rd Generation Synchrotron Light Sources |
| J. Synchrotron Rad. 3 (1996) 197-198 |
| |
| B.Niemann, T.Wilhein, T.Schliebe, R.Plontke, O.Fortagne, I.Stolberg, M.Zierbock |
| A special method to create gratings of variable line density by low voltage electron beam lithography |
| Microelectronic Engineering 30 (1996) 49-52 |
| |
| G.Schmahl, D.Rudolph, B.Niemann, P J.Thieme, G.Schneider |
| Röntgenmikroskopie |
| Naturwissenschaften 83 (1996) 61 - 70 |
| |
| T. Salditt, D. Lott, T.H. Metzger, J. Peisl, G. Vignaud, J.F. Legrand, G. Grübel, P. Hoghoj, O. Schärpf |
| Characterization of interface roughness in W/Si multilayers by high resolution diffuse x-ray scattering |
| Physica B 221 13, (1996) |
| |
| T. Salditt, D. Lott, T.H. Metzger, J. Peisl, R. Fischer, J. Zweck, P. Hoghoj, O. Schärpf, G. Vignaud |
| Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers |
| Europhys.Lett. 36, 565 (1996) |
| |
| T. Salditt, D. Lott, T.H. Metzger, J. Peisl, G. Vignaud, P. Hoghoj, O. Schärpf, P. Hinze, R. Lauer |
| Interfacial roughness and related growth mechanisms in sputtered W/Si multilayers |
| Phys.Rev.B 54, 5860 (1996) |
